Probe assembly with multi-directional freedom of motion and mounting assembly therefor

ABSTRACT

An improved test probe assembly has an improved mounting assembly which provides the test probe multi-directional freedom of movement with respect to a base in order to resist damage frequently caused to the test probe. The improved mounting assembly may, for example, include at least a first resilient mount disposed on the base and having at least a first support and at least a first resilient element. The at least a first resilient element, which may, for example, be at least a first spring, is deflectable when the test probe engages a structure, such as a device under testing (DUT). Accordingly, the improved test probe assembly of the invention can be deflected an infinite number of positions, in order to resist damage caused, for example, by misalignment between the probe and the DUT.

CROSS-REFERENCE TO RELATED APPLICATIONS

This is application is a continuation of U.S. application Ser. No.11/780,913 entitled “PROBE ASSEMBLY WITH MULTI-DIRECTIONAL FREEDOM OFMOTION AND MOUNTING ASSEMBLY THEREFOR,” filed Jul. 20, 2007, which is acontinuation of U.S. application Ser. No. 11/051,012, now U.S. Pat. No.7,268,567.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The invention relates generally to testing of electronic devices and,more particularly, to a mounting assembly for a test probe which allowsmulti-directional freedom of motion of the test probe. The inventionalso relates to a test probe assembly.

2. Background Information

Numerous types of handheld electronic devices are known. Examples ofsuch devices include, for instance, personal data assistants (PDAs),handheld computers, two-way pagers, cellular telephones, and the like.Many handheld electronic devices feature wireless communicationcapability, although many such handheld electronic devices arestand-alone. In order to assure proper operation, the handheldelectronic devices are typically tested as part of their assemblyprocess.

The tests which are conducted on the handheld electronic device ofteninclude a test of radio frequency (RF) features and related circuitry ofthe device. As is known in the art, RF devices enable, among otherthings, the wireless communication capabilities of the handheldelectronic device. Other radio communications enabled by RF devicesinclude, without limitation, navigation communications, satellitecommunication and navigation and telecommunications, antennacommunications, and the like. Testing of handheld electronic device RFfeatures is typically accomplished by way of a switch and probe.

FIGS. 1 and 2 show a representative example of a probe 2, which may bean RF probe, and a switch 4 for testing the wireless communicationfeatures of the handheld electronic device (not shown). The probe 2includes an elongated body 6 with a first, switch engaging end 8, asecond end 10 and a mounting plate 12 fixed to the body 6 proximate thesecond end 10. In the example of FIG. 1, the second end 10 includes areceptacle for connection to, for example, a coaxial cable (not shown).The first end 8 includes a spring-loaded retractable portion 14 having aswitch-actuating probe, or wire 16 (FIG. 2). In operation, theretractable portion 14 retracts into the elongated body 6 upon engagingthe switch 4 (best shown in FIG. 2), thereby enabling insertion of thewire 16 into the switch 4. The switch 4 may be mounted, on a printedcircuit board (PCB) 18, as shown in FIG. 2. The switch 4 includes areceptacle 20 with sloped walls 22, 24 for guiding the probe wire 16into the switch 4 in order to engage and open a movable contact 26(FIGS. 3A and 3B).

FIGS. 3A and 3B generally show the movable contact 26 of switch 4. FIG.3A shows the movable contact 26 in the closed position, while FIG. 3Bshows the movable contact 26 in the open position after having beenengaged by the probe wire 16. As shown, engaging and opening the switch4 with the probe wire 16 breaks the circuit, isolating portions of thecircuit or device for independent testing.

The probe 2 may be mounted in a stationary position or, alternatively,may be mounted on a robotic arm (not shown) or other suitable movablemember. For example, in certain testing circumstances, a series of atleast partially assembled handheld electronic devices (not shown) is feddown an assembly line (not shown), with each electronic device stoppingat a number of stations including, for example, an RF testing station,in order to be tested one at a time. At the testing station, the probe 2would be moved to engage the switch 4, which is coupled to the handheldelectronic device. In either mounting configuration, the probe 2 issubstantially rigid. The rigid manner in which the probe 2 are mountedoften results in the probe 2 becoming damaged during a testing sequence.

Specifically, the probe 2 is typically rigidly mounted to the stationarystructure or the robotized structure (not shown) by fasteners, such asscrews (not shown), which are inserted through holes 28,30 in themounting plate 12. Such rigid mounting of the probe 2 neglects toprovide sufficient freedom of movement of the probe 2 and, therefore,renders the probe incapable of accommodating misalignment between theprobe 2 and the device under test (DUT) and, more particularly,misalignment between the switch 4 on the DUT, and the probe 2. Due tothe small size of the components involved, i.e., the switch 4, the probe2 and, in particular, the wire 16, misalignment can easily occur, and infact, frequently does occur. The small and thus fragile nature of theprobe wire 16 renders it particularly susceptible to damage duringtesting sequences. Specifically, when misaligned, as shown in FIG. 2,the probe wire 16 bends (not shown) upon hitting an adjacent portion ofthe switch 4 (e.g., sloped side walls 22,24). Although the rectractableportion 14 of the probe 2 includes a conical shaped recess 32 havingsloped sides 34,36 which are adapted to assist in centering the probe 2,perfect alignment and insertion of the probe wire 16 through the centerof the switch receptacle 20 is seldom achieved. The rigid nature of theprobe 2, therefore, tends to result in the misaligned wire 16 beingbent. Bending the wire 16 can damage (e.g., yield) and even break it.Bending also creates problems when the wire 16 is retracted followingtesting and when an attempt is made to re-aim the wire 16 during asubsequent testing sequence.

There is a need, therefore, for a probe mounting assembly and probecapable of accommodating misalignment between the probe and the DUT, andfor an associated method of employing the probe.

SUMMARY OF THE INVENTION

An improved test probe mounting assembly resists damage frequentlycaused to the probe during, for example, a testing sequence on a deviceunder testing (DUT). By providing to the test probe multi-directionalfreedom of movement with respect to a base of the mounting assembly, theimproved mounting assembly and test probe accommodate misalignmentbetween the probe and the DUT.

Accordingly, an aspect of the invention is to provide an improvedmounting assembly for allowing a test probe to, throughmulti-directional freedom of movement, facilitate alignment of the probewith the DUT and, therefore, reduce the possibility of bending orotherwise damaging a portion of the probe.

Another aspect of the invention is to provide an improved test probeassembly that, in response to being misaligned with the DUT, moves inaccordance with one or more of a plurality of directions of freedom ofmovement before yielding or fracture of the test probe occurs.

Another aspect of the invention is to provide an improved mountingassembly with at least a first resilient mount for providingmulti-directional freedom of movement of the test probe.

Another aspect of the invention is to provide an improved mountingassembly for a test probe of the type used to test an electronic device,in which the general nature of the mounting assembly can be stated asincluding a base and at least a first resilient mount disposed on thebase, the at least a first resilient mount being structured to receivethe test probe thereon and to be at least partially deflectable to allowmulti-directional freedom of movement of the test probe with respect tothe base. The at least a first support may include a spacer and ashoulder, the spacer being disposed on the base, and the shoulder beingdisposed on the spacer, the at least a first resilient element beingdisposed on one of the base and the shoulder and being structured tobias at least a portion of the test probe toward the other of the baseand the shoulder. The at least a first support may include a firstsupport and a second support, wherein the spacers of the first andsecond supports are structured to extend through first and secondopenings of an attachment member of the test probe. The at least a firstresilient element may include a first resilient element and a secondresilient element, the first and second resilient elements beingindependently deflectable to provide the multi-directional freedom ofmovement. The spacer may be a smooth shank, the shoulder being disposedat an end of the smooth shank, wherein the smooth shank is structured tobe movably disposed within an opening of an attachment member of thetest probe.

Another aspect of the invention is to provide an improved probeassembly, the general nature of which can be stated as including a testprobe comprising an elongated body and an attachment member, the bodybeing disposed on the attachment member, and a mounting assemblycomprising a base, and at least a first resilient mount disposed on thebase, the test probe being disposed on the at least a first resilientmount, the at least a first resilient mount being deflectable to allowmulti-directional freedom of movement of the test probe with respect tothe base. The at least a first resilient mount may include a firstsupport and a second support that each include a smooth shank and ashoulder, a first resilient element having a through bore and a secondresilient element having a through bore, wherein the smooth shanks ofthe first and second supports are disposed within the through bores ofthe first and second resilient elements, and wherein the first andsecond resilient elements bias the attachment member of the test probetoward the shoulders of the first and second supports and areindependently deflectable to provide the multi-directional freedom ofmovement of the attachment member upon the smooth shanks. The test probemay be movable with respect to the base of mounting assembly in at leasta first direction and a second direction, wherein in the firstdirection, the test probe is movable generally perpendicularly towardthe base and wherein in the second direction, the test probe ispivotable to a position which is not perpendicular with respect to thebase. The test probe may also be movable in a third direction withrespect to the base, the third direction including transverse movementof the attachment member between the smooth shanks of the first andsecond supports. The first and second resilient elements may be movablebetween an undeflected position and a plurality of deflected positionswherein both of the first and second resilient elements being disposedin substantially the same deflected position of the plurality ofdeflected positions provides the movement in the first direction, andwherein each of the first and second resilient elements being disposedin a different one of the undeflected position and the plurality ofdeflected positions provides the movement in the second direction.

BRIEF DESCRIPTION OF THE DRAWINGS

A full understanding of the invention can be gained from the followingDescription of the Preferred Embodiments when read in conjunction withthe accompanying drawings in which:

FIG. 1 is a perspective view of a prior art probe and a RF switch beforebeing engaged and actuated by the probe.

FIG. 2 is a cross-sectional view taken along line 2-2 of FIG. 1, showingthe switch-engaging end of the probe as it engages the RF switch, whichis misaligned with respect to the probe wire.

FIG. 3A is a schematic view of the RF switch of FIG. 1 before beingengaged by the probe.

FIG. 3B is a schematic view of the RF switch of FIG. 1 after beingengaged and actuated by the probe.

FIG. 4 is an exploded, perspective view of a probe assembly including amounting assembly for providing multi-directional freedom of movement ofthe test probe in accordance with the invention, and a switch.

FIG. 5 is a perspective, assembled view of the probe assembly of FIG. 4,modified to employ a different base in accordance with anotherembodiment of the invention.

Similar numerals refer to similar parts throughout the specification.

DESCRIPTION OF THE PREFERRED EMBODIMENTS

For purposes of illustration, the invention will be described as appliedto a radio frequency (RF) probe for engaging and actuating an associatedswitch to test RF circuits and features of a handheld electronic device.However, it will become apparent that the invention could also beapplied to any other known or suitable type of probe and switch fortesting a wide variety of circuits, systems and features of anyelectronic device.

Directional phrases used herein, such as, for example, left, right,clockwise, counterclockwise, up, down and derivatives thereof, relate tothe orientation of the elements shown in the drawings and are notlimiting upon the claims unless expressly recited therein.

As employed herein, the term “fastener” refers to any suitableconnecting or tightening mechanism expressly including, but not limitedto, screws, bolts and the combinations of bolts and nuts (e.g., withoutlimitation, lock nuts) and bolts, washers and nuts. For example, theexemplary fastener shown and discussed herein is a shoulder screw,although any other suitable fastener could alternatively be employed.

FIG. 4 shows an improved probe assembly 100 in accordance with theinvention. The probe assembly 100 includes an improved mounting assembly150 in accordance with the invention that is depicted in FIGS. 4-5. Moreparticularly, the probe assembly 100 includes the test probe 102 and themounting assembly 150 which has a base 152 and at least a firstresilient mount 154 disposed on the base 152. Two resilient mounts154,155 are shown in the examples of FIGS. 4 and 5, although a singleresilient mount configuration (not shown) or any suitable configurationhaving more than two resilient mounts (not shown), could also beemployed. As will be described in further detail herein, the at least afirst resilient mount (e.g., 154,155) is deflectable to allowmulti-directional freedom of movement of the test probe 102 with respectto the base 152. The phrase “multi-directional freedom of movement,” asused herein, refers to the ability of the test probe 10, as provided bythe mounting assembly 150 of the invention, to move in a plurality ofdirections with respect to the base 152 and will be more fullyunderstood with reference to FIG. 5, as described hereinbelow.

The exemplary test probe 102 is an RF probe 102 much like the RF probe 2illustrated and describe previously in connection with FIGS. 1 and 2.Such probes are commonly referred to in the art as microwave coaxialconnectors and are commercially available from Murata Electronics NorthAmerica, Inc. of 2200 Lake Park Drive, Smyrna, Ga. Similarly, the switch4, commonly referred to as a SWD type switch, which is compatible withthe probe 102 is also available from Murata Electronics. The foregoingprobe, switch combination is commonly used, for example, forcharacteristic measurement of handheld telephone and microwave circuitsand is, therefore, ideal for use in testing RF systems of handheldelectronic devices (not shown). It will, however, be appreciated thatthe mounting assembly 150 of the invention could alternatively beemployed with any known or suitable probe other than the one shown anddescribed herein.

As shown in FIG. 4, like probe 2 of FIGS. 1-3, probe 102 has anelongated body 106 with a first, switch-engaging end 108, a second end110 and an attachment member 112 disposed proximate the second end 110.The first end 108 also includes the same retractable portion 114 whichretracts into the body 106 to expose the switch-actuator, or wire 116.Accordingly, probe 102 and the features thereof may be identical toprobe 2 (FIGS. 1-3) or one or more features of the probe 102 may bedifferent. For example, the exemplary attachment member 112 has beenmodified, in comparison to mounting plate 12 of FIGS. 1 and 2, to createfirst and second slots 128,130 in place of the first and second holes28,30 (FIGS. 1-2). While the exemplary slots 128,130 function tofacilitate the multi-directional freedom of movement of the probe 2 withrespect to the base 150, it is understood that the probe 2 of FIGS. 1and 2 could also be employed with the mounting assembly 150, withoutthis or any other modification.

The exemplary probe 102 is disposed on first and second resilient mounts154,155. Each resilient mount 154,155 includes at least a first support156,168 disposed on the base 152 (best shown in FIG. 5) and at least afirst resilient element 180,184. The example shown and described hereinincludes first and second supports 156,168 and first and secondresilient elements 180,184. However, any suitable number of supports andresilient elements, in any suitable configuration, could alternativelybe employed without departing form the concept of the invention. Forsimplicity of disclosure, only one support 156 will be described indetail, as the other support 168 is essentially identical in structure.The support 156 includes a spacer 158 and a shoulder 160, the spacer 158being disposed on the base 152 and the shoulder 160 being disposed onthe spacer 158, as shown in FIG. 5. The resilient element 182,184 isdisposed on the base 152 and biases at least a portion of the test probe102 toward the shoulder 160. It will be appreciated, however, that theresilient element 182,184 could alternatively be disposed on theshoulder 160 and bias at least a portion of the test probe 102 towardthe base 152.

In a preferred embodiment of the invention, shown in FIGS. 4 and 5,spacers 158,170 of first and second supports 156,168 are disposed infirst and second openings (e.g., first and second slots 128,130) of thetest probe attachment plate 112. In this embodiment, the at least afirst resilient element includes first and second resilient elements,such as the exemplary first and second linear springs 180,184, shown.Each linear spring 180,184 has a through bore 182,186 through the centerof the spring coils. Of course, other known or suitable types ofresilient elements (not shown) could be employed. Similarly, as bestshown in FIG. 4, the exemplary supports 156,168 are threaded fastenerseach having a first threaded end 162,174 and a second end 164,176 withan enlarged head 166,178 having the shoulder 160,172, wherein the spacerof each fastener 156,168 is a generally smooth shank 158,170 between theshoulder 160,172 and the threaded first end 162,174. However, any knownor suitable alternative support or fastener could be employed.

As best shown in FIG. 5, the smooth shanks 158,170 of the exemplarythreaded fasteners 156,168 are disposed in the slots 128,130 (FIG. 4) ofthe test probe attachment member 112 and extend through the throughbores 182,186 of the first and second exemplary linear springs 180,184.The threaded first ends 162,174 (FIG. 4) of the exemplary first andsecond fasteners 156,168 are threadingly secured within correspondingfirst and second threaded apertures 190,192 (FIG. 4) in the base 152. Inthis manner, the exemplary resilient mounts 154,155 are retained on thebase 152, such that the first and second springs 180,184 bias theattachment member 112 of the test probe 102 toward the shoulders 160,172of the fasteners 156,168. The first and second resilient elements (e.g.,linear springs 180,184) are, therefore, independently deflectable toprovide the multi-directional freedom of movement of the attachmentmember 112 upon the smooth shanks 158,170.

The base 152 of the mounting assembly 150 may be made from any known orsuitable material and may be configured in any suitable manner in orderto accommodate one or more resilient mounts (e.g., 154,155) inaccordance with the invention. For example, two different bases 152 and152′ are shown in FIGS. 4 and 5, respectively, while all othercomponents of the test probe assembly 150, other than the biases152,152′, are the same.

In the examples of FIGS. 4 and 5, both bases, 152 (FIG. 4) and 152′(FIG. 5), have first and second threaded apertures 190,192; 190′, 192′which are generally aligned with the openings (e.g., slots 128,130 (FIG.4)) of the test probe attachment member 112. This is in order tofacilitate movement of the ends 194,196 of the attachment member 112upon the smooth shanks 158,170 of the first and second fasteners156,168. Movement of the ends 194,196 may occur either independent orsimultaneous. Both bases, 152 (FIG. 4) and 152′ (FIG. 5), also includean oversized aperture 198 (FIG. 4), 198′ (FIG. 5) which receives aportion (e.g., second end 110) of the elongated body 106 of the testprobe 102 and allows the multi-directional freedom of movement of thetest probe 102 with respect to the base 152,152′. The oversized aperture198,198′ also provides access to the second end 110 of the probe 102 inorder to, for example, connect a coaxial cable (not shown) thereto.Additionally, bases 152,152′ both include a number of mounting apertures(e.g., 200,202 of FIG. 4; 200′,202′ of FIG. 5). It will be appreciatedthat these mounting apertures may be of any suitable number andconfiguration necessary for connection of the mounting assembly 150 to aseparate structure (e.g., a stationary element or a robotized piece oftesting equipment (not shown)). For example, base 152 of FIG. 4 includesa pair of elongated openings 200,202 through opposing corners 204,206 ofthe base 152, while base 152′ of FIG. 5 includes a pair of through holes200′,202′ proximate opposing corners 204′,206′. It is understood thatthe slots 200,202 (FIG. 4) and 200′,202′ (FIG. 5) are intended toreceive fasteners (not shown) or any other known or suitable fasteningmechanism structured to secure the entire test probe assembly 100 to theseparate structure. Such fastening mechanism may include, withoutlimitation, a portion of the separate structure (not shown) which isstructured to be inserted into the mounting apertures 200,202; 200′,202′to secure the base 152,152′ thereto.

It will be appreciated that the base (e.g., 152,152′) may be anysuitable size and shape. For example, base 152′ of FIG. 5 is generallyrectangular in shape, having four corners 204′,206′, 208 and 210(partially hidden behind fastener 156 of FIG. 5). However, the base 152of FIG. 4 has been modified to remove corners 208 and 210. Such amodification might be made, for example, to permit a variety ofdifferent mounting orientations of the test probe assembly 100. It willfurther be appreciated that, while the exemplary bases 152,152′ shownand described herein are contemplated as being made from FR-4, commonlyreferred to as G-10, and to have a thickness of about 3/16 inches, thatany know or suitable alternative material of any suitable thickness,could be employed. G-10 is a rigid, wear resistant material commonlyused to make printed circuit boards (PCBs).

Accordingly, in view of the foregoing, it can be appreciated that themounting assembly 150 of the invention can be fashioned economicallyfrom existing or readily available components (e.g., springs; shoulderscrews), can be readily employed with a wide variety of existing probetypes, and can be easily adapted for use with many different types oftesting equipment (not shown).

Continuing to refer to FIG. 5, the multi-directional freedom of movementprovided by the mounting assembly 150 of the invention, will now bedescribed in greater detail. As previously discussed, “multi-directionalfreedom of movement,” as used herein, refers to the ability of the testprobe 102, as provided by the mounting assembly 150 of the invention, tomove among an infinite number of directions and positions with respectto the base 152, 152′. Specifically, the test probe assembly 100 of theinvention is resilient as opposed to being rigidly mounted. Therefore,upon engaging a structure, such as the RF switch 4 (FIG. 4) of a DUT, ifthe switch 4 is not perfectly aligned with the switch actuator, or wire116 (FIG. 5) of the probe 102 (see, e.g. misaligned probe 2 and switch 4of FIG. 2), the exemplary probe 102, by way of the mounting assembly 150of the invention, will deflect as necessary to accommodate themisalignment and, more importantly, to avoid bending the wire 116. Inother words, the resilient mounts (e.g., 154,155) of the inventionadvantageously provide the exemplary probe 102 with “play” duringprobing operations. Thus, the probe 102 is provided with theaforementioned multi-directional freedom of movement not only duringengagement between the DUT and the probe 102, but also throughout theduration of the probing operation. This is a significant improvementover other probes and probing systems which, at best, have employed atest socket having a floating guide plate which is intended to protectthe probe while it is at rest. Floating guide plates are mountable, forexample, onto a load board (e.g., a PCB). However, such guide plates notonly represent an entirely different concept, but they also fail toaddress the rigid and thus problematic nature of the probe mount.Accordingly, the invention provide a significant improvement whichovercomes the known disadvantages (e.g., damaged and broken probe wires)of other test probes (e.g., probe 2 of FIGS. 1-2).

More specifically, the test probe 102 is movable with respect to thebase 152′ of the mounting assembly 150 in an infinite number ofdirections. For simplicity of disclosure, these infinite directions willbe broadly characterized into first, second, and third directions. Tohelp depict these directions of movement, a X,Y,Z Cartesian coordinatekey and two axes 212,214 have been added to FIG. 5. The first axis 212is aligned with the X-direction. The second axis 214 is aligned with theZ-direction. The first direction is indicated generally by arrows 216and 218, which represent movement of the test probe 102 which isgenerally toward the base 152′ (e.g., up and down in the Z-direction,with respect to FIG. 5). Each of the resilient elements (e.g., springs180,184) is movable between an undeflected position (shown in FIG. 5)and a plurality of deflected positions (not shown) to provide this andother movements of the probe 102. Accordingly, in the example shown, itwill be understood that movement in the first direction is provided bydeflection of both springs 180,184 between the undeflected position andsubstantially the same deflected position of the plurality of deflectedpositions. Such movement would entail both ends 194,196 (FIG. 4) of thetest probe attachment member 112, and thus the test probe 102, movingsubstantially the same distance toward the base 152′ in the directionindicated by arrows 216 and 218.

As previously discussed, the springs 180,184 are also independentlydeflectable in the direction indicated by arrows 216 and 218. Thus, asecond direction of movement with respect to the base 152′ can beachieved wherein the test probe 102 pivots to one of an infinite numberof positions in which the probe 102 is translatable, or pivoted, withrespect to the base 152′. One example of such a pivoted (e.g., withoutlimitation, non-perpendicular) test probe position is indicatedgenerally by dashed line 220 of FIG. 5 which represents the test probehaving been pivoted with respect to the base 152′, in the direction ofarrow 222. It will be understood that such movement in the seconddirection corresponds to the first spring 180 being disposed in adifferent one of the undeflected position and the plurality of deflectedpositions than the second spring 184. It will further be understood thatthe foregoing example (e.g., dashed line 220) is but one of an infinitenumber of possible probe positions.

The test probe 102 is further movable in at least a third direction withrespect to the base 152′. The third direction includes transversemovements of the test probe attachment member 112, for example, betweenthe smooth shanks 158,170 of the exemplary first and second fasteners156,168. The exemplary slots 128,130 (FIG. 4) of the attachment member112 facilitate such movement in the third direction, but the attachmentmember 112 is generally retained between the fastener shanks 158,170, asshown. Movement in the third direction typically occurs in a plane(e.g., the X-Y plane) which is substantially parallel to the horizontalX-Y plane of the base 152′. Among the movements included within thiscategory, are movements in the directions generally indicated by arrows224 and 226, which are generally in the Y direction (from theperspective of FIG. 5), and arrow 228, which is generally in the Xdirection (from the perspective of FIG. 5). Of course, it will beunderstood that the ends 194,196 (FIG. 4) of the test probe attachmentmember 112 may be moved different distances and even in differentdirections thus providing additional movements such as, for example,rotation of the attachment member 112 and test probe 102 about theX-axis 212, as indicated generally by the arrow 230, or about the Z-axis214, as indicated generally by arrow 232. It will also be understoodthat the multi-directional freedom of movement provided by the mountingassembly 150 of the invention also includes any possible combination ofthe aforementioned movements and directions of movement.

Accordingly, the invention provides an improved test probe assembly 100and an improved mounting assembly 150 to provide multi-directionalfreedom of movement of the test probe 102 to one of an infinite numberof positions. Therefore, the invention can accommodate misalignmentbetween the test probe 102 and the switch 4 of the DUT and substantiallyminimize the potential for damage to the probe 102.

While specific embodiments of the invention have been described indetail, it will be appreciated by those skilled in the art that variousmodifications and alternatives to those details could be developed inlight of the overall teachings of the disclosure. Accordingly, theparticular arrangements disclosed are meant to be illustrative only andnot limiting as to the scope of the invention which is to be given thefull breadth of the claims appended and any and all equivalents thereof.

1. A mounting assembly for an elongated test probe structured to engagea device under testing, the elongated test probe including a body, anactuator and a retractable portion, the mounting assembly comprising: abase; and at least a first resilient mount mechanically coupled to thebase, the at least a first resilient mount structured to receive thetest probe thereon and to generally bias the test probe away from saidbase, thereby being at least partially deflectable to allow movement ofthe test probe toward and away from the base, wherein, responsive to thetest probe engaging the device under testing, the at least a firstresilient mount is structured to establish and maintain a generallyvertically aligned relationship between the test probe and the deviceunder testing, and wherein, when the test probe engages the device undertesting, the retractable portion of the test probe is structured toretract into the body of the test probe, thereby exposing the actuatorto test the device under testing.
 2. The mounting assembly of claim 1wherein the at least a first resilient mount includes at least a firstsupport disposed on the base and at least a first resilient element. 3.The mounting assembly of claim 2 wherein the at least a first supportincludes a spacer and a shoulder, the spacer being disposed on the base,and the shoulder being disposed on the spacer, the at least a firstresilient element being structured to bias at least a portion of thetest probe toward one of the base and the shoulder.
 4. The mountingassembly of claim 3 wherein the at least a first resilient element isdisposed on one of the base and the shoulder and is structured to biasthe at least a portion of the test probe toward the other of the baseand the shoulder.
 5. The mounting assembly of claim 2 wherein the atleast a first resilient element is at least a first spring structured tobe disposed between the base and a portion of the test probe.
 6. A probeassembly comprising: a test probe for engaging a device under testing,the test probe comprising an elongated body, an actuator, a retractableportion and an attachment member, the body being disposed on theattachment member; and a mounting assembly comprising: a base, and atleast a first resilient mount mechanically coupled to the base, the testprobe being disposed on the at least a first resilient mount, the atleast a first resilient mount generally biasing the test probe away fromsaid base, thereby being deflectable to allow movement of the test probetoward and away from the base, wherein, responsive to the test probeengaging the device under testing, the at least a first resilient mountestablishes and maintains a generally vertically aligned relationshipbetween the test probe and the device under testing, and wherein, whenthe test probe engages the device under testing, the retractable portionof the test probe retracts into the body of the test probe, therebyexposing the actuator to test the device under testing.
 7. The probeassembly of claim 6 wherein the at least a first resilient mountincludes at least a first support disposed on the base and at least afirst resilient element.
 8. The probe assembly of claim 7 wherein the atleast a first support includes a spacer and a shoulder, the spacer beingdisposed on the base, and the shoulder being disposed on the spacer, theat least a first resilient element biasing at least a portion of thetest probe toward one of the base and the shoulder.
 9. The probeassembly of claim 8 wherein the at least a first resilient element isdisposed on one of the base and the shoulder and biases the at least aportion of the test probe toward the other of the base and the shoulder.10. The probe assembly of claim 9 wherein the at least a first supportincludes a first support and a second support, the first and secondsupports each including a spacer and a shoulder; wherein the attachmentmember of the test probe includes a first opening and a second opening;and wherein the spacers of the first and second supports are disposedwithin the first and second openings of the attachment member.
 11. Aprobe assembly comprising: a test probe for engaging a device undertesting, the test probe comprising an elongated body, an actuator, aretractable portion and an attachment member, the body being disposed onthe attachment member; and a mounting assembly comprising: a base, andat least a first resilient mount disposed on the base, the test probebeing disposed on the at least a first resilient mount, the at least afirst resilient mount generally biasing the test probe away from saidbase, thereby being deflectable to allow movement of the test probetoward and away from the base, wherein the base of the mounting assemblyincludes an oversized aperture which receives a portion of the body ofthe test probe to allow the multi-directional freedom of the body withrespect to the base, wherein, responsive to the test probe engaging thedevice under testing, the at least a first resilient mount establishesand maintains a generally vertically aligned relationship between thetest probe and the device under testing, and wherein, when the testprobe engages the device under testing, the retractable portion of thetest probe retracts into the body of the test probe, thereby exposingthe actuator to test the device under testing.
 12. The mounting assemblyof claim 1 wherein the device under testing is a switch; wherein thetest probe is an RF probe; wherein the actuator is a wire; and wherein,when the RF probe engages the switch, the retractable portion of the ofRF probe retracts into the body of the RF probe in order for the wire toengage and actuate the switch.
 13. The probe assembly of claim 6 whereinthe device under testing is a switch; wherein the test probe is an RFprobe; wherein the actuator is a wire; and wherein, when the RF probeengages the switch, the retractable portion of the of RF probe retractsinto the body of the RF probe in order for the wire to engage andactuate the switch.
 14. The probe assembly of claim 11 wherein thedevice under testing is a switch; wherein the test probe is an RF probe;wherein the actuator is a wire; and wherein, when the RF probe engagesthe switch, the retractable portion of the of RF probe retracts into thebody of the RF probe in order for the wire to engage and actuate theswitch.